When developing cutting-edge materials, the structure and composition must be controlled at the atomic level. Sumika Chemical Analysis Service therefore uses cutting-edge transmission electron microscopes and develops unique pre-processing technologies—focusing on three keywords: ultra-fine, ultra-small, and ultra-thin. We provide a range of analysis methods to suit your needs, such as ultra high sensitivity quantification of metallic contamination on wafer surfaces, surface molecular contaminants (SMC), or device parts (piping, ceramic, or quartz).

Our Services

• Analysis of Contamination
• Evaluation of Manufacturing Process Contamination
• SiC (Power Semiconductors)
• Surface Analysis and Morphological Observation
• TEM Observation of Microstructures